Escalating design size and complexity, more complex design-rule checks (DRCs), higher DRC rule count and increasing design-for-manufacturability (DFM) challenges are causing the physical verification ...
People learning about semiconductor manufacturing might well be confused by the concept of metal fill. It seems perfectly intuitive that laying out a complex chip will result in some regions with ...
A recent blog post discussed the use of virtual metal fill (VMF) to predict the effects of real metal fill when performing RC extraction on a chip layout. This enables static timing analysis (STA) ...
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