Semiconductor wafer defect pattern recognition and classification is a crucial area of research that underpins yield enhancement and quality assurance in microelectronics manufacturing. The discipline ...

A new technical paper titled “Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing” was published by researchers at Infineon Technologies, University of Padova and ...

A defect in a semiconductor chip may be smaller than a human hair but can create big problems in your everyday life, from crippling your car's steering to making your laptop more susceptible to ...

WEST LAFAYETTE, Ind. — A defect in a semiconductor chip may be smaller than a human hair but can create big problems in your everyday life, from crippling your car’s steering to making your laptop ...

As semiconductor manufacturers aim to produce devices at the 5-nanometer node, the ability to find tiny defects created inadvertently during the fabrication process becomes harder. In addition, there ...

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.

In diamonds (and other semiconducting materials), defects are a quantum sensor's best friend. That's because defects, essentially a jostled arrangement of atoms, sometimes contain electrons with an ...

Modern advanced packaging processes and shrinking semiconductor device sizes mean that it is vital to consistently eliminate sub-20 nm defects and surface contaminants. To do this effectively, the ...

Nanoindenters are precise, adaptable, and user-friendly tools for performing nanoscale mechanical testing on various films and surfaces. Nanoindentation systems with electromagnetic actuation achieve ...

KLA Instruments™, a division of KLA Corporation, has expanded its defect inspection and metrology portfolio in 2023 to include new systems for semiconductor process development and control, including ...