The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on ...
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Making Microscopy Simple with Automated Control
Hitachi High-Tech has recently introduced the SU3800SE and SU3900SE scanning electron microscopes (SEMs), which enhance the capabilities of the field-proven SU3800 and SU3900 models. Image Credit: ...
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