This article examines the use of femtosecond (fs) laser ablation for site-specific TEM sample preparation in a FIB-SEM. Various workflows are shown facilitating TEM lamella preparation of regions of ...
Rare earth elements (REEs) are vital in the production of high-specification electronic devices, including computer components, LEDs, smartphones, catalysts in electric motors (automotive), engines or ...
Carl Zeiss has launched the AURIGA® Laser, a new advanced system combining the specific advantages of the AURIGA® CrossBeam (FIB-SEM) workstation with the capabilities of a pulsed micro-focus laser ...
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