A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.

Automated image analysis has transformed the traditional approach to colony counting in microbiology, offering objective, reproducible and high‐throughput solutions that overcome the labour-intensive ...

A hot potato: Simply known as "Lenna," the test image was scanned by Alexander Sawchuk at the University of Southern California's Signal and Image Processing Institute in 1973. It's been used in ...

Have you ever come across a research paper that is so dense it becomes overwhelming to get information from it? At times, you might find yourself buried under a pile of textbooks and journal articles ...